Add avoiding pitfalls to bibliography
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@@ -13,7 +13,7 @@
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author = {Arlat, J. and Aguera, M. and Amat, L. and Crouzet, Y. and Fabre, J.-C. and Laprie, J.-C. and Martins, E. and Powell, D.},
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date = {1990-02},
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journaltitle = {IEEE Transactions on Software Engineering},
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shortjournal = {IIEEE Trans. Software Eng.},
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shortjournal = {IEEE Trans. Softw. Eng.},
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volume = {16},
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number = {2},
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pages = {166--182},
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@@ -66,7 +66,7 @@
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author = {Forin, P.},
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date = {1990-09},
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journaltitle = {IFAC Proceedings Volumes},
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shortjournal = {IFAC Proceedings Volumes},
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shortjournal = {IFAC Proc. Vol.},
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volume = {23},
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number = {2},
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pages = {79--84},
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@@ -109,7 +109,7 @@
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author = {Hoffmann, Martin and Ulbrich, Peter and Dietrich, Christian and Schirmeier, Horst and Lohmann, Daniel and Schröder-Preikschat, Wolfgang},
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date = {2016-03},
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journaltitle = {Software Quality Journal},
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shortjournal = {Software Qual J},
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shortjournal = {Softw. Qual. J.},
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volume = {24},
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number = {1},
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pages = {87--113},
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@@ -173,7 +173,7 @@
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author = {Poledna, Stefan},
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date = {1994-05},
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journaltitle = {Real-Time Systems},
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shortjournal = {Real-Time Syst},
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shortjournal = {Real-Time Syst.},
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volume = {6},
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number = {3},
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pages = {289--316},
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@@ -246,6 +246,24 @@
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file = {/home/christoph/Notes/Zotero/storage/7BXMSTFW/Hardware_Error_Detection_Using_AN_Codes.pdf}
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}
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@inproceedings{schirmeierAvoidingPitfallsFaultInjection2015,
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title = {Avoiding {{Pitfalls}} in {{Fault-Injection Based Comparison}} of {{Program Susceptibility}} to {{Soft Errors}}},
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booktitle = {2015 45th {{Annual IEEE}}/{{IFIP International Conference}} on {{Dependable Systems}} and {{Networks}}},
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author = {Schirmeier, Horst and Borchert, Christoph and Spinczyk, Olaf},
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date = {2015-06},
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pages = {319--330},
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publisher = {IEEE},
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location = {Rio de Janeiro, Brazil},
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doi = {10.1109/DSN.2015.44},
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url = {https://ieeexplore.ieee.org/document/7266861},
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urldate = {2026-08-18},
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abstract = {Since the first identification of physical causes for soft errors in memory circuits, fault injection (FI) has grown into a standard methodology to assess the fault resilience of computer systems. A variety of FI techniques trying to mimic these physical causes has been developed to measure and compare program susceptibility to soft errors.},
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eventtitle = {2015 45th {{Annual IEEE}}/{{IFIP International Conference}} on {{Dependable Systems}} and {{Networks}} ({{DSN}})},
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isbn = {978-1-4799-8629-3},
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langid = {english},
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file = {/home/christoph/Notes/Zotero/storage/Z5YD828W/Schirmeier et al. - 2015 - Avoiding Pitfalls in Fault-Injection Based Comparison of Program Susceptibility to Soft Errors.pdf}
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}
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@incollection{schirmeierDependabilityAspectsConfigurable2021,
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title = {Dependability {{Aspects}} in {{Configurable Embedded Operating Systems}}},
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booktitle = {Dependable {{Embedded Systems}}},
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@@ -361,7 +379,6 @@
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author = {Solouki, Mohammadreza Amel and Angizi, Shaahin and Violante, Massimo},
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date = {2024},
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journaltitle = {IEEE Access},
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shortjournal = {IEEE Access},
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volume = {12},
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pages = {180939--180967},
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issn = {2169-3536},
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