Add avoiding pitfalls to bibliography

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2026-09-10 17:14:00 +02:00
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@@ -13,7 +13,7 @@
author = {Arlat, J. and Aguera, M. and Amat, L. and Crouzet, Y. and Fabre, J.-C. and Laprie, J.-C. and Martins, E. and Powell, D.},
date = {1990-02},
journaltitle = {IEEE Transactions on Software Engineering},
shortjournal = {IIEEE Trans. Software Eng.},
shortjournal = {IEEE Trans. Softw. Eng.},
volume = {16},
number = {2},
pages = {166--182},
@@ -66,7 +66,7 @@
author = {Forin, P.},
date = {1990-09},
journaltitle = {IFAC Proceedings Volumes},
shortjournal = {IFAC Proceedings Volumes},
shortjournal = {IFAC Proc. Vol.},
volume = {23},
number = {2},
pages = {79--84},
@@ -109,7 +109,7 @@
author = {Hoffmann, Martin and Ulbrich, Peter and Dietrich, Christian and Schirmeier, Horst and Lohmann, Daniel and Schröder-Preikschat, Wolfgang},
date = {2016-03},
journaltitle = {Software Quality Journal},
shortjournal = {Software Qual J},
shortjournal = {Softw. Qual. J.},
volume = {24},
number = {1},
pages = {87--113},
@@ -173,7 +173,7 @@
author = {Poledna, Stefan},
date = {1994-05},
journaltitle = {Real-Time Systems},
shortjournal = {Real-Time Syst},
shortjournal = {Real-Time Syst.},
volume = {6},
number = {3},
pages = {289--316},
@@ -246,6 +246,24 @@
file = {/home/christoph/Notes/Zotero/storage/7BXMSTFW/Hardware_Error_Detection_Using_AN_Codes.pdf}
}
@inproceedings{schirmeierAvoidingPitfallsFaultInjection2015,
title = {Avoiding {{Pitfalls}} in {{Fault-Injection Based Comparison}} of {{Program Susceptibility}} to {{Soft Errors}}},
booktitle = {2015 45th {{Annual IEEE}}/{{IFIP International Conference}} on {{Dependable Systems}} and {{Networks}}},
author = {Schirmeier, Horst and Borchert, Christoph and Spinczyk, Olaf},
date = {2015-06},
pages = {319--330},
publisher = {IEEE},
location = {Rio de Janeiro, Brazil},
doi = {10.1109/DSN.2015.44},
url = {https://ieeexplore.ieee.org/document/7266861},
urldate = {2026-08-18},
abstract = {Since the first identification of physical causes for soft errors in memory circuits, fault injection (FI) has grown into a standard methodology to assess the fault resilience of computer systems. A variety of FI techniques trying to mimic these physical causes has been developed to measure and compare program susceptibility to soft errors.},
eventtitle = {2015 45th {{Annual IEEE}}/{{IFIP International Conference}} on {{Dependable Systems}} and {{Networks}} ({{DSN}})},
isbn = {978-1-4799-8629-3},
langid = {english},
file = {/home/christoph/Notes/Zotero/storage/Z5YD828W/Schirmeier et al. - 2015 - Avoiding Pitfalls in Fault-Injection Based Comparison of Program Susceptibility to Soft Errors.pdf}
}
@incollection{schirmeierDependabilityAspectsConfigurable2021,
title = {Dependability {{Aspects}} in {{Configurable Embedded Operating Systems}}},
booktitle = {Dependable {{Embedded Systems}}},
@@ -361,7 +379,6 @@
author = {Solouki, Mohammadreza Amel and Angizi, Shaahin and Violante, Massimo},
date = {2024},
journaltitle = {IEEE Access},
shortjournal = {IEEE Access},
volume = {12},
pages = {180939--180967},
issn = {2169-3536},