README: publications update
Change-Id: I4794dbba1e1fc28398bd040a5ffbc4ff821e5a6c
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README.md
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README.md
@ -132,9 +132,15 @@ Publications about FAIL*
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Selected publications using FAIL*
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Selected publications using FAIL*
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- M. Hoffmann, P. Ulbrich, C. Dietrich, H. Schirmeier, D. Lohmann, and
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- M. Hoffmann, F. Lukas, C. Dietrich, and D. Lohmann. dOSEK: The design and
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W. Schröder-Preikschat. Experiences with software-based soft-error
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implementation of a dependability-oriented static embedded kernel. In
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mitigation using AN-codes. Software Quality Journal, 2015. (accepted).
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Proceedings of the 21st IEEE Real-Time and Embedded Technology and
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Applications (RTAS '15), Los Alamitos, CA, USA, Apr. 2015. IEEE Computer
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Society Press.
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- M. Hoffmann, P. Ulbrich, C. Dietrich, H. Schirmeier, D. Lohmann, and W.
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Schröder-Preikschat. Experiences with software-based soft-error mitigation
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using AN codes. Software Quality Journal, pages 1–27, 2015.
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- I. Stilkerich, P. Taffner, C. Erhardt, C. Dietrich, C. Wawersich, and
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- I. Stilkerich, P. Taffner, C. Erhardt, C. Dietrich, C. Wawersich, and
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M. Stilkerich. Team Up: Cooperative Memory Management in Embedded
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M. Stilkerich. Team Up: Cooperative Memory Management in Embedded
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@ -142,30 +148,27 @@ Selected publications using FAIL*
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Architectures and Synthesis for Embedded Systems (CASES '14). ACM,
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Architectures and Synthesis for Embedded Systems (CASES '14). ACM,
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October 2014.
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October 2014.
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- H. Schirmeier, C. Borchert, and O. Spinczyk. Rapid fault-space
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- H. Schirmeier, C. Borchert, and O. Spinczyk. Rapid fault-space exploration by
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exploration by evolutionary pruning. In Proceedings of the 33rd
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evolutionary pruning. In Proceedings of the 33rd International Conference on
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International Conference on Computer Safety, Reliability and
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Computer Safety, Reliability and Security (SAFECOMP '14), Lecture Notes in
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Security (SAFECOMP '14), Lecture Notes in Computer
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Computer Science, pages 17–32. Springer-Verlag, Sept. 2014.
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Science. Springer-Verlag, Sept. 2014.
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- M. Hoffmann, C. Borchert, C. Dietrich, H. Schirmeier, R. Kapitza,
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- M. Hoffmann, C. Borchert, C. Dietrich, H. Schirmeier, R. Kapitza, O.
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O. Spinczyk, and D. Lohmann. Effectiveness of fault detection
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Spinczyk, and D. Lohmann. Effectiveness of fault detection mechanisms in
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mechanisms in static and dynamic operating system designs. In
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static and dynamic operating system designs. In Proceedings of the 17th IEEE
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Proceedings of the 17th IEEE International Symposium on
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International Symposium on Object-Oriented Real-Time Distributed Computing
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Object-Oriented Real-Time Distributed Computing (ISORC '14). IEEE
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(ISORC '14), pages 230–237. IEEE Computer Society Press, June 2014.
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Computer Society Press, June 2014.
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- H. Schirmeier, L. Rademacher, and O. Spinczyk. Smart-hopping: Highly
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- H. Schirmeier, L. Rademacher, and O. Spinczyk. Smart-hopping: Highly efficient
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efficient ISA-level fault injection on real hardware. In Proceedings
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ISA-level fault injection on real hardware. In Proceedings of the 19th IEEE
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of the 19th IEEE European Test Symposium (ETS '14). IEEE Computer
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European Test Symposium (ETS '14), pages 69–74. IEEE Computer Society Press,
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Society Press, May 2014.
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May 2014.
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- M. Hoffmann, P. Ulbrich, C. Dietrich, H. Schirmeier, D. Lohmann, and
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- M. Hoffmann, P. Ulbrich, C. Dietrich, H. Schirmeier, D. Lohmann, and W.
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W. Schröder-Preikschat. A practitioner's guide to software-based
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Schröder-Preikschat. A practitioner's guide to software-based soft-error
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soft-error mitigation using AN-codes. In Proceedings of the 15th
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mitigation using AN-codes. In Proceedings of the 15th IEEE International
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IEEE International Symposium on High Assurance Systems Engineering
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Symposium on High Assurance Systems Engineering (HASE '14), pages 33–40,
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(HASE '14), Miami, Florida, USA, Jan. 2014. IEEE Computer Society
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Miami, Florida, USA, Jan. 2014. IEEE Computer Society Press.
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Press.
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- C. Borchert, H. Schirmeier, and O. Spinczyk. Return-address
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- C. Borchert, H. Schirmeier, and O. Spinczyk. Return-address
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protection in C/C++ code by dependability aspects. In Proceedings of
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protection in C/C++ code by dependability aspects. In Proceedings of
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